JOURNAL / ISSUES / SHORT SEARCH     ISSN 2310-6697/ISSN-L 2310-6697
 
open transactions on independent scientific-engineering research
FUNKTECHNIKPLUS # JOURNAL
Théorie-Expérimentation-Métrologie-Logiciel-Applications
 

ISSUE 40 - SUNDAY 31 MAY 2026 - YEAR 13

 
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PAPERS
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40-1
 
# Electrical Engineering - Théorie
 
A Short Note on Some Considerations Regarding
Partial Discharge (PD) Measurements
in Gas Insulated Switchgear (GIS)
 
M. G. Danikas and R. Sarathi
 
ABSTRACT
 
Defects appearing in gas insulated switchgear (GIS) are discussed. Some relations regarding partial discharge (PD) magnitudes with the applied electric field to the whole arrangement are given. The importance of the electric field at the tip of a defect is emphasized.
 
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40-2
 
# Telecommunications Engineering - Théorie - Métrologie
 
Comparing a NanoVNA with a LabVNA Part 3:
Similarities and Differences
 
Nikolitsa I. Yannopoulou and Petros E. Zimourtopoulos
 
ABSTRACT
 
We complete the presentation of our comprehension regarding the revolutionary concept "Error Model", that was appeared out of the blue in May 1968, when Richard A. Hackborn, by using the Microwave Journal, revealed to the public "An Automatic Network Analyzer System". Since in a previous paper we proved that the one-port error model is the same for both of our NanoVNA and LabVNA, now we show how this fact can be produced again by considering an equivalent four-port microwave junction for our NanoVNA, that is as we previously did it for our LabVNA. In this way, the almost absolute agreement, that we experimentally noticed between these two very different VNAs in the case of one-port measurements using our standard 50-Ohm box up to 900 MHz, is completely justified theoretically as the result of a bilinear (Moebius) transformation. Furthermore, we proceed in a first investigation of the impressive differences we observe in the values of all intermediately involved quantities, which we measure or compute using our specific couple of NanoVNA and LabVNA. Finally, we reveal the similarities of the terms appearing in the expression of the reflection coefficient and conclude this work by expressing a condition in order to expect identical measurements when we are using substantially different VNAs like these two of ours.
 
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